The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 05, 1994
Filed:
Mar. 13, 1992
Christopher J Percival, Williamsville, NY (US);
David A Luce, Clarence Center, NY (US);
Leica Inc., Buffalo, NY (US);
Abstract
Optical properties of a lens, including localized defects, are determined by analyzing the refracted image produced by transmitting a beam of light through an aperture and a lens to be tested. The image is reflected onto a light sensitive detecting surface. Information obtained from the light detecting surface is digitized and sent to an Image Processing Unit which calculates the optical properties of the lens. The aperture may consist of a single shaped opening or alternatively a plurality of concentric, annular rings. Correction lenses may be employed, either permanently or selectively, to alter the refracted beam before the beam intersects the detecting surface.