The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 08, 1994
Filed:
Oct. 14, 1992
Mishio Hayashi, Ohsato, JP;
Advantest Corporation, Tokyo, JP;
Abstract
Periods P.sub.k between the one edges of input pulses are measured one after another by a successive period measuring circuit, and at the same time, the time interval between the one edge to the other of each input pulse, that is, a pulse width W.sub.k, is measured by a time interval measuring circuit. The measured periods are sequentially accumulated and each accumulated value is made to correspond to each pulse, as the time at which the measurement of its pulse width was started. In an interpolation part, pulse widths, which are assumed to be obtained at regular time intervals, are computed, by an interpolation method, from the sequence of measured pulse widths and the their measurement starting times. In a Fourier transform part, the pulse width data obtained by the interpolation is subjected to a Fourier transform to obtain the frequency components of a pulse width jitter.