The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 15, 1994
Filed:
Nov. 14, 1991
Kazuhiro Sugino, Yokohama, JP;
Shingo Akasaka, Zushi, JP;
Hiroko Imanishi, Yokohama, JP;
Junichi Saeki, Yokohama, JP;
Kunihiko Nishi, Kokubunji, JP;
Asao Nishimura, Ushiku, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
A product specification complex analysis system is provided which inputs product specifications of an external form and materials, design parameters determined by analysis and evaluation in the specifications, the range of the change of the parameters and a plurality of items of estimates as external input data, calls out and executes an evaluation program corresponding to each item of the estimates and stored in advance, from a group of evaluation programs whenever the item of the estimates is renewed, in order to sequentially evaluate the product specifications for each item of the estimates, determines the fluctuation of analysis results with respect to the change of the design parameters within designated ranges of changes, evaluates trade-off between the analysis results by changing the design parameters from the analysis results corresponding to the items of the estimates so as to make maximal evaluation values in an evaluation formula as an estimate function with weights comprising each of these analysis results, and can thus obtain optimum design parameters.