The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 25, 1994
Filed:
Feb. 28, 1991
Robert G Knollenberg, Boulder, CO (US);
Particle Measuring Systems, Inc., Boulder, CO (US);
Abstract
Submicron diameter particle detection utilizing a high density array is disclosed. The high density array, such as a charge coupled device, is utilized to detect light scattered at a sensing region by particles illuminated by a light source, such as a laser source. Charge storage is utilized to buffer each data frame transferred from the high density array and the multiple serial outputs are processed by parallel processing that includes threshold detection and analog-to-digital converting. A micro-computer and associated digital storage receives the digital outputs and provides outputs indicative of submicron particle sizing. Further improvement in minimum detectable particle sizing of particles carried by a fluid is realized by use of beam shaping optics to shape the illumination beam passed through the sensing region to form either an astigmatic (highly elliptical) beam cross-section, with the fluid being directed towards the imaging system orthogonal to the object plane, or a circular beam cross-section with the flow directed parallel to object plane, and with the focal point of the beam being substantially centrally positioned within the sensing region in either case.