The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 04, 1994
Filed:
Dec. 09, 1991
David A Bossen, Palo Alto, CA (US);
Lee M Chase, Los Gatos, CA (US);
Leonard M Anderson, San Jose, CA (US);
Michael K Norton, Los Gatos, CA (US);
Measurex Corporation, Cupertino, CA (US);
Abstract
A sensor and method is provided for measuring one or more select components of a material. In one embodiment, a method measures the components by emitting electromagnetic radiation at the material and detecting the intensity of the emerging radiation at separate locations from the source. In another embodiment, a sensor provides a radiation source for emitting radiation at a sheet, a plurality of detecting means, offset substantially the same from the source, for detecting radiation after interaction with the sheet and first and second reflectors for directing the radiation so that the radiation makes multiple interactions with the sheet when moving from the source to the detecting means. The invention can accurately measure the select components (e.g., moisture) of different grades of paper by eliminating the effects of the scattering power and determining absorption power at each band of the spectrum considered necessary for a particular measurement.