The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 14, 1993

Filed:

Oct. 30, 1992
Applicant:
Inventors:

Daniel L Huang, Poughkeepsie, NY (US);

Louis L Hsu, Fishkill, NY (US);

Wen-Yuan Wang, Hopewell Junction, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L / ;
U.S. Cl.
CPC ...
437 44 ; 437 45 ; 437228 ; 437978 ; 148D / ; 156645 ; 156653 ;
Abstract

A deep submicron transistor fabrication method that employs only optical lithography involves the formation of a relatively wide aperture using optical techniques; the formation of composite sidewalls having differential etch resistance in the aperture to define a final aperture width less than that available with conventional optical techniques; the etching of the final aperture to expose a controlled channel length; the implantation of the channel through the aperture; and the implantation of source and drain with the sidewalls protecting previously doped LDD regions in the active area.


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