The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 07, 1993
Filed:
Feb. 11, 1992
Applicant:
Inventors:
Nicolaas C Van Hijningen, Eindhoven, NL;
Cornelis J Van Nimwegen, Eindhoven, NL;
Johannes A Verhoeven, Maarheeze, NL;
Assignee:
U.S. Philips Corporation, New York, NY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ;
U.S. Cl.
CPC ...
356445 ; 356432 ; 356435 ; 356 73 ; 250572 ;
Abstract
An arrangement for measuring the reflection and/or transmission of an object comprises a frame 1, a carrier 7 for the object, a radiation source 15 and a detector unit. The detector unit, which comprises one or more radiation-sensitive detectors 17A, 17B may be arranged on a holder 13 which is pivotable about a pivotal axis 13a. A slide 5, which is movable parallel to the pivotal axis, may be provided for moving the carrier and the detector unit rectilinearly towards and away from one another.