The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 19, 1993

Filed:

Dec. 31, 1991
Applicant:
Inventors:

James Chan, Folsom, CA (US);

Robert E Larsen, Shingle Springs, CA (US);

Steve Eskildsen, Folsom, CA (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C / ;
U.S. Cl.
CPC ...
365201 ; 365190 ; 365203 ; 371 211 ;
Abstract

The method of testing a memory array of SRAM cells each of which includes memory transistors, bit and bit# lines, precharge circuitry, and an output test terminal involving the steps of connecting selected bit and bit# lines of selected SRAM cells to the output test terminal, disconnecting the memory transistors of the selected SRAM cells from the bit and bit# lines, disconnecting the bit and bit# lines from the precharge circuitry, enabling the column select circuitry to select the columns of the selected SRAM cells, applying a preselected level voltage to the output test terminal, and measuring any current which flows.


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