The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 12, 1993
Filed:
Nov. 02, 1990
Adrian Carbine, Portland, WA (US);
Intel Corporation, Santa Clara, CA (US);
Abstract
A VLSI chip debug and production test apparatus that allows an engineer to view the state of hundreds of signals internal to a chip in real-time without probing, which greatly simplifies the isolation of circuit, speed, logic, and microcode bugs. For production testing, it also provides the ability to check the state of these internal signals on a clock-by-clock basis. The mechanism uses a gated XOR-input serial shift-register cell (10), which is stepped out underneath major buses in otherwise unpopulated areas of the chip. Several of these cell groups are linked together to form a scanout path of the desired length, the operation of which is controlled with a single input pin (40). Output data is channeled through a shared output pin (19) to a VLSI tester (16). In the tester (16) the data (19) is checked and accumulated by back-end software over multiple test-loop iterations, and formatted into a readable form.