The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 07, 1993

Filed:

Mar. 22, 1991
Applicant:
Inventors:

Harriss King, Cupertino, CA (US);

Lee M Chase, Los Gatos, CA (US);

Leonard M Anderson, San Jose, CA (US);

Assignee:

Measurex Corporation, Cupertino, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
356429 ; 250571 ;
Abstract

A device for characterizing the formation of a sheet material is described. The device comprises a formation sensor for measuring the basis weight of the sheet material as the material passes through the sensor, and signal processing circuitry which receives a basis weight signal from the formation sensor and which produces three types of outputs, which outputs characterize: (1) the magnitude of variation in the sheet basis weight; (2) the strength of the weakest portion or portions of the sheet; and (3) the size of the flocs comprising the sheet. The formation sensor includes a light pipe that is held against the sheet as the sheet moves through the sensor, and that directs a small spot of light transmitted through the sheet to a light detecting device. The magnitude of small-scale variation in the sheet basis weight is computed by determining the ratio between average value of the basis weight signal and the varying or AC component of the basis weight signal.


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