The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 27, 1993
Filed:
May. 06, 1992
Bruce J Penney, Portland, OR (US);
Tektronix, Inc., Wilsonville, OR (US);
Abstract
A Moire measurement system uses spectral analysis to characterize the moire effect on a television signal introduced by a particular device. A known television signal is processed by the particular device, such as a video tape recorder, and the output is input to a spectral analyzer, such a windowed fast Fourier transform. The spectral analyzer includes input gating to select a portion of the known television signal from the particular device. The frequency of the desired component of the known television signal, together with the rms values of all the other components introduced by the Moire effect, give the X- and Y-coordinates of a point on an output display. The window is moved across the test signal, giving a family of X- and Y-coordinates that characterize the Moire effect as a function of amplitude, frequency or video pedestal. The Moire characteristics of the particular device then may be used to correct the output of the particular device.