The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 08, 1993

Filed:

Jun. 25, 1990
Applicant:
Inventors:

Stuart O Nelson, Athens, GA (US);

Venkatrkrishna S Kandala, Athens, GA (US);

Richard G Leffler, Athens, GA (US);

Kurt C Lawrence, Snellville, GA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324664 ; 324667 ; 324649 ;
Abstract

A method for the nondestructive measurement of the moisture content of single grain kernels, seeds, nuts, or fruits which is independent of their weight, thickness, and projected area. At least two independent parameters of complex electrical impedance or admittance of a single grain kernel, seed, nut, or fruit are measured at two different frequencies and the moisture content is calculated therefrom.


Find Patent Forward Citations

Nelson, Stuart. (1993). Single kernel, seed, nut, or fruit dielectric moisture content (U.S. Patent No. 5218309). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5218309

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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