The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 01, 1993

Filed:

Mar. 01, 1991
Applicant:
Inventors:

Kazuya Yonemoto, Tokyo, JP;

Tetsuya Iizuka, Kanagawa, JP;

Kazushi Wada, Kanagawa, JP;

Koichi Harada, Kanagawa, JP;

Satoshi Nakamura, Kanagawa, JP;

Assignee:

Sony Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L / ;
U.S. Cl.
CPC ...
377 60 ; 257231 ; 257245 ;
Abstract

An interline transfer or frame interline transfer CCD solid image sensor is adapted to read out signal charges from light receiving sections of a matrix array by means of vertical charge transfer sections and horizontal charge transfer sections. A plurality of horizontal charge transfer sections are formed for lowering the horizontal transfer frequency. The voltage transition in the transfer gate across the horizontal charge transfer sections is caused to occur stepwise or temporally slowly to improve the transfer efficiency across the horizontal charge transfer sections. A smear drain region for sweeping out unnecessary charges is formed along the horizontal charge transfer sections. The transfer electrode of the horizontal charge transfer sections connected to the busline wiring is patterned to clear contact holes provided in the smear drain region to provide for positive overflow without increasing the chip area.


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