The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 11, 1993

Filed:

Mar. 19, 1992
Applicant:
Inventor:

Andrew J Harding, Almondsbury, GB;

Assignee:

Renishaw Metrology Limited, Gloucestershire, GB;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
33559 ; 33561 ; 33558 ;
Abstract

A touch probe (10) has a housing (12) and stylus-supporting member (14) biased into a kinematic rest position relative to the housing (12) by a biasing mechanism. The biasing mechanism includes a first helical spring (40) which acts between a movable shuttle (44) and an intermediate member (48). The shuttle (44) is movable within a bore (46) and the position of the shuttle within the bore may be adjusted by the action of an adjusting screw (74). A second helical spring (42) acts between intermediate member (48) and the supporting member (14). The first spring (40) has a low spring rate and is pre-loaded such that the second spring (42), which has a high spring rate, will deflect first upon movement of the shuttle (44) or supporting member (14). Once the pre-load of spring (40) has been overcome the two springs (40,42) co-operate to act as a single spring whose spring rate is the sum of the reciprocals of the spring rates of springs (40,42). This provides adjustment of the biasing force with only a small movement of the shuttle (44) while simultaneously providing large deflections of the stylus-supporting member (14) opposed with a low rate of increase of biasing force.


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