The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 04, 1993
Filed:
Jan. 16, 1991
Applicant:
Inventors:
Assignee:
Sumitomo Electric Industries, Ltd., Osaka, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ; C03B / ; C03B / ;
U.S. Cl.
CPC ...
356 731 ; 65-311 ; 65-312 ; 356382 ;
Abstract
A method and an apparatus for measuring the thickness of a coating provided around a cylindrical object such as an optical fiber optically. The cylindrical object is irradiated by a measuring light and the light derived from the object is received by a photo-detector so that the intensity of the derived light is measured to thereby detect the thickness of the coating.
Inoue, Akira. (1993). Method and apparatus for optically measuring the thickness of a coating (U.S. Patent No. 5208645). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5208645
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