The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 04, 1993

Filed:

Jul. 03, 1991
Applicant:
Inventors:

Kazuyuki Tsurishima, Saitama, JP;

Teruaki Sakurada, Saitama, JP;

Assignees:

Sym-Tek Systems, Inc., San Diego, CA (US);

Advantest Corp., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ; G01R / ;
U.S. Cl.
CPC ...
3241 / ; 324 725 ; 3241 / ; 439 70 ;
Abstract

A contact assembly for use in testing electric devices such as integrated circuits (IC's) and the like is comprised of a test socket and a corresponding carrier module for positioning the electric devices to be tested in alignment with the test socket. The carrier module is provided with a holding mechanism for retaining electronic devices to be tested in their proper position in the seat of the module, the holding mechanism being retractable so as to not interfere with the electrical contact between the socket and the electric device. In another aspect of the present invention, the contact assembly is provided with a slide positioning mechanism for slidably positioning the electronic device in its proper location on the seat of the carrier module.


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