The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 23, 1993

Filed:

Mar. 27, 1991
Applicant:
Inventor:

Koji Masutani, Tokyo, JP;

Assignee:

Jeol Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356346 ;
Abstract

There is disclosed a Fourier transform spectrometer using a pulsed light source which can be selected from various types of light sources. The spectrometer Fourier-transforms the interferogram obtained by an interferometer to give rise to a spectrum. The spectrometer is characterized in that it includes a means for impulsively lighting up the light source for the interferometer at predetermined intervals of time and a means for extracting the envelope of the output from the interferometer as an interferogram. The spectrometer can further include a means for periodically applying a stimulus to the sample. In this case, time-resolved Fourier transform spectroscopy can be effected. The differential method can also be applied by lighting up the light source for the interferometer at intervals half the intervals at which the stimuli are given and by extracting the output from the interferometer via a band-pass filter and via a lock-in amplifier.


Find Patent Forward Citations

Loading…