The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 02, 1993
Filed:
Jul. 03, 1991
Mark W Klug, San Diego, CA (US);
Thomas E Toth, San Diego, CA (US);
Stephen R Lamb, San Diego, CA (US);
Steven D Swendrowski, San Diego, CA (US);
Kazuyuki Tsurishima, Saitama, JP;
Mitsuaki Tani, Saitama, JP;
Sym-Tek Systems, Inc., , US;
Advantest Corp., , US;
Abstract
A separation and transfer apparatus for use in an electronic test system for testing electronic devices such as IC's, and the like. The apparatus has a housing for holding in a horizontal position, a magazine containing such electronic devices, an air blower for blowing compressed air at the electronic devices at an angle through a slit of the magazine so that the electronic devices are separated from one another and urged in a desired direction, a piston pin for insertion into a space developed between the last electronic device in the magazine and one end of the magazine, an advancing apparatus for changing the horizontal position of the air blower and the piston pin and for expelling the electronic devices from the magazine, and a controller for controlling the timing of the air blowing, the movement of the advancing apparatus, and the operation of the piston pin. The invention also includes a transfer apparatus having mounted thereon a second air blower and piston pin for transferring the electronic devices thus expelled from the magazine to the next stage of the test system, such as a temperature chamber. Another aspect of the present invention is a universal electronic device magazine for use in such separation and transfer apparatus, which magazine need not be changed or varied despite differences in the shape and kinds of the electronic devices to be tested.