The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 02, 1993

Filed:

Oct. 01, 1990
Applicant:
Inventors:

Masahiko Nagai, Kanagawa, JP;

Hiroo Watai, Hadano, JP;

Takaharu Nagumo, Kokubunji, JP;

Kaoru Moriwaki, Hadano, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
364489 ; 364578 ; 371 23 ;
Abstract

A logic circuit to be an object for fault simulation is logically modified into a logic circuit configuration using logic gates of a predetermined basic gate form. Pin management data indicative of a correspondence of pins of the logic gates to a position of fault assumption of each of the pins prior to logic modification is formed. Logic simulation is then performed by injecting a fault logic value into the position of fault assumption of each of the pins of the gate of the logic circuit subsequent to the logic modification corresponding to each of the pins prior to the logic modification with reference to the pin management data, thereby implementing a fault simulation for detecting the fault of the logic circuit.


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