The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 20, 1992

Filed:

Apr. 16, 1991
Applicant:
Inventors:

Haruo Okano, Tokyo, JP;

Sadahisa Noguchi, Tokyo, JP;

Makoto Sekine, Yokohama, JP;

Assignee:

Kabushiki Kaisha Toshiba, Kanagawa, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B05D / ;
U.S. Cl.
CPC ...
427572 ; 427576 ; 427578 ; 427579 ; 4272551 ; 4272552 ; 4272553 ; 4272556 ; 427255 ;
Abstract

A thin film forming method includes the steps of supporting a semiconductor substrate having a trench or unevenness thereon in a reaction vessel, introducing a reactive gas into the reaction vessel, activating the reactive gas to form a deposit species, exhausting the interior of the reaction vessel, and cooling the semiconductor substrate below the liquid faction temperature of the deposit species to cause the deposit species to become a material deposited on the semiconductor substrate.


Find Patent Forward Citations

Okano, Haruo. (1992). Method for forming a film on a substrate by activating a reactive gas (U.S. Patent No. 5156881). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5156881

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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