The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 13, 1992
Filed:
Dec. 12, 1989
Dennis L Holmbo, Redmond, OR (US);
Wendelyn Gavett, Bend, OR (US);
Barry L Rosenow, Bend, OR (US);
Michael S Overton, Beaverton, OR (US);
Tektronix, Inc., Wilsonville, OR (US);
Abstract
A method for examining a propagative medium, such as a signal transmission cable, that requires the acquisition and examination of a minimum number of data points to determine the presence of an anomaly in the medium. When an anomaly is detected, its characteristics, such as loation, type and amount of loss are determined. The characteristics are then displayed. If the anomaly is a reflectionless loss, the region containing the anomaly is examined repetitively to determine its location and to improve the accuracy of its location measurement. With each successive level of examination, additional samples are collected within the region. The new samples are combined with the existing samples to reduce random noise in the data. Through this method the location of the anomaly is re-determined with greater accuracy.