The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 22, 1992
Filed:
Jul. 17, 1990
Tamio Saito, Tokyo, JP;
Toshio Yamamoto, Tokyo, JP;
Naoharu Ohikata, Tokyo, JP;
Jiro Ono, Tokyo, JP;
Nippon Steel Corporation, Tokyo, JP;
Abstract
An apparatus for assembly and testing of an IC element having a first section designated for primary functions of the IC element and a second section designated for testing of the IC element, including a substrate made of a film of insulating material and having an IC-mounting portion defining a position of IC element to be assembled a plurality of first leads mounted on the substrate and connected to the first section of the IC element when mounted to the IC-mounting portion, a plurality of second leads connected to the second section of the IC element, a single first test pad for connection of the first leads thereto, second test pads for connection of the respective second leads thereto and circuit for connecting the first leads to at least one of the second leads for testing the IC element through the first and second pads.