The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 25, 1992
Filed:
Apr. 26, 1991
Applicant:
Inventors:
Thane Smith, Middletown, MD (US);
Ho-Chung Huang, Potomac, MD (US);
Chi Hsiang Lee, Potomac, MD (US);
Assignee:
COMSAT, Washington, DC (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ; G01R / ;
U.S. Cl.
CPC ...
3241 / ; 324 96 ; 3241 / ;
Abstract
Electrical devices are characterized by optically triggering an electrical signal onto the device and then optically sampling the electrical signal waveform on the device.
Smith, Thane. (1992). Non-destructive semiconductor wafer probing system using laser pulses to (U.S. Patent No. 5142224). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5142224
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile