The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 14, 1992
Filed:
Jul. 17, 1991
Atsushi Yamada, Mizuhomachi, JP;
Mitsuru Yamada, Tokyo, JP;
Kouichi Suefuji, Tokyo, JP;
Tsutomu Negishi, Tokyo, JP;
Kunihiko Uchida, Tokyo, JP;
Jeol Ltd., Tokyo, JP;
Abstract
Method and an apparatus for automatically moving the focal plane of the electron beam produced by a scanning electron microscope to the position of specimen surface. An auxiliary coreless coil of a low inductance is disposed close to the objective lens. The exciting current fed to the coil is varied to move the focal plane of the electron beam toward the optical axis. At each of discrete positions of the focal plane, a specimen is scanned with the electron beam. The resulting secondary electrons are detected by a detector. Individual output signals from the detector are compared to select the maximum signal. Then, only the objective lens is excited. The exciting current fed to the objective lens is modified to move the focal plane along the position closest to the specimen surface.