The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 23, 1992
Filed:
Dec. 27, 1990
Rick L Hudson, China Grove, NC (US);
Michael G Belanger, Oak Park, IL (US);
Compax Corp., Lexington, NC (US);
Abstract
A system for analyzing fabrics, knitted or woven, particularly to perform in-process analysis of stitch count or yarn count. A camera positioned over the fabric is exposed by means of a high speed strobe to form a freeze-frame image, which is digitized and stored for computer processing. An early processing step involves scanning the image along a large number of angularly displaced scanning axes, to determine the construction line of the fabric, which may be skewed relative to the imaging camera. The image is thereafter scanned along lines parallel to (and/or at right angles to) the construction line. A more precise and useful analysis is made possible by this technique. Color insensitivity is achieved without the use of expensive infra-red strobe devices, by using a common xenon strobe and a filter to exclude wave lengths below the near-infra-red range.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile