The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 26, 1992
Filed:
Dec. 04, 1990
Yoshiaki Kakino, Sakyo-ku, Kyoto 606, JP;
Shigeaki Tokumo, Asaguchi, JP;
Tetsuo Nakamura, Kawasaki, JP;
Torao Takeshita, Nagoya, JP;
Other;
Yasuda Kogyo Kabushiki Kaisha, Okayama, JP;
Mitutoyo Corporation, Tokyo, JP;
Mitsubishi Denki Kabushiki Kaisha, Tokyo, JP;
Abstract
A numerical control (NC) device 10 for a machine tool 1 provided with a measurement probe 2b effects measurements of a work 4 on the machine table 5 after a working process. A measurement program, generated by the NC device by modifying a working program, controls the relative movement of the probe 2b with respect to the workpiece 4 such that the probe 2b moves along the contour of the worked portion of the workpiece 4 with a displacement from the neutral position thereof, wherein the displacement of the probe is sampled at a predetermined sampling period. A working error calculation program 17 calculates the working error from the sampled displacements. If the working error is judged correctable, a outside tolerance range and correction re-working is effected so as to reduce the working error. The measurement/re-working cycles are repeated until the working error is within tolerance.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile