logo

For the Inventor, By the Inventor

The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 5110537 B1

PDFFull Text
Date of Patent:
May. 05, 1992

Filed:

Feb. 26, 1990

Water quality inspection method and apparatus therefor

Applicant:
Inventors:

Hideo Miura, Ibaraki, JP;

Asao Nishimura, Ushiku, JP;

Shinji Sakata, Katsuta, JP;

Tasuku Shimizu, Hitachi, JP;

Shigeo Hattori, Ibaraki, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:

Antonelli, Terry, Stout & Kraus

Primary Examiner:

Brooks H Hunt

Assistant Examiner:

Meena Chelliah

Int. Cl.
CPC ...
G21C / ;
U.S. Cl.
CPC ...
376305 ; 376245 ; 376306 ;
Abstract

A method and apparatus for inspecting the change in a water quality in terms of the change in a corrosion rate by detecting the capacity change between opposed electrodes due to the corrosion of electrode surfaces. As a result, the water quality can be continuously monitored over a long time while leaving the electrodes in the water to be inspected. Thus, the method and apparatus are suited for controlling the water quality especially in an atomic reactor vessel.

Find Patent Forward Citations

Miura, Hideo. (1992). Water quality inspection method and apparatus therefor (U.S. Patent No. 5110537). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5110537

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…