The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 1992

Filed:

Apr. 10, 1991
Applicant:
Inventors:

Takafumi Kimura, Hiratsuka, JP;

Hiroshi Nakao, Atsugi, JP;

Hideki Yamawaki, Isehara, JP;

Masaru Ihara, Chigasaki, JP;

Keigo Nagasaka, Nagareyama, JP;

Assignee:

Fujitsu Limited, Kawasaki, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J / ;
U.S. Cl.
CPC ...
250341 ; 2503362 ; 505842 ; 427 62 ;
Abstract

A method of evaluating the characteristics of superconductors, comprising: irradiating light to a superconductor held at a predetermined temperature; detecting light transmitted through the superconductor and composing a spectrum of the transmitted light; and using the obtained spectrum, calculating a ratio of the number of electrons contributing to a normal conduction to the number of electrons contributing to a superconduction in the superconductor, the ratio being effective at said predetermined temperature. A process and an apparatus for forming superconductor films by using the method are also disclosed.


Find Patent Forward Citations

Kimura, Takafumi. (1992). Method of evaluating characteristics of superconductors and process and (U.S. Patent No. 5107119). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5107119

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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