The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 21, 1992
Filed:
Jan. 15, 1991
Minoru Maruyama, Tokyo, JP;
Takahiko Kagawa, Tokyo, JP;
Tahiko Inukai, Tokyo, JP;
Michio Nonaka, Tokyo, JP;
Kiyoshi Kajiwara, Tokyo, JP;
Taiyo Fishery Co., Ltd., Tokyo, JP;
Abstract
There is disclosed a method for inspecting leakage of a sealed container which is effectively used for detecting a leaking place such as a pin hole, crack, etc. of a sealed container which contains foods, pharmaceuticals, chemical industrial products, etc. A method for inspecting leakage of a sealed container according to the present invention comprises changing an internal pressure of a vacuum chamber provided with an eddy-current displacement sensor to a predetermined degree of vacuum from a normal pressure after putting a sealed container to be inspected having a conductive material on at least at a portion of the container in the chamber; detecting an amount of expansion of the sealed container at the degree of vacuum in time sequence by the eddy-current displacement sensor; and determining any change in the amount of expansion after a time when the detected amount of expansion shows the maximum value, thereby to determine any pin hole formed in the sealed container.