The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 04, 1992
Filed:
Apr. 30, 1987
Kenneth H Womack, Rochester, NY (US);
Brian J Kwarta, Pittsford, NY (US);
David H Outterson, Victor, NY (US);
James R Reda, Rochester, NY (US);
Eastman Kodak Company, Rochester, NY (US);
Abstract
Projectors and cameras disposed about an object under test obtain digital moire information of overlapping aspects (views) of the object. The system is calibrated using a calibration pattern of straight lines on a flat reference surface and a projected pattern of lines which are perpendicular to the lines of the calibration pattern and contain marker fringes between predetermined lines. Each aspect is calibrated individually by stepping the calibration pattern along the axis of each camera so as to obtain a plurality of tables which relate phase information to distance in each of a plurality of planes spaced successively closer to the camera. The calibration tables define a calibrated volume in space between the cameras and projectors. When the object under test is located in this volume, the video signals from the camera are converted into digital moire information. This information is directly related to the calibration information and is converted with the aid of the calibration information into absolute distance measurements along the perimeters of cross-sections through the object.