Test system for acquiring, calculating and displaying representations of

Abstract

A system for testing electronic devices includes a waveform generator, a data acquisition system, and a computer. The waveform generator continuously generates a test signal having adjustable parameters set by the computer in response to user input. The data acquisition system acquires data representing the output of the device under test in response to the input signal and stores the last N acquired data values. The computer transfers a data sequence from the acquisition system to another memory and generates in a window on a terminal screen a wagveform display representing the stored data sequence. The computer also displays menu items referencing mathematical operations that may be performed on one or more data sequences. When a user selects one of the menu items, the computer prompts the user to select one or more windows containing waveform displays. Thereafter, the computer performs the selected operation on the data sequence controlling the waveform displays in the selected windows. When the result of the operation is a new data sequence, the computer stores the new data sequence in memory and then produces in a user-selected window a new waveform display based on the new data sequence.