The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 31, 1991
Filed:
Mar. 01, 1989
Applicant:
Inventors:
Assignee:
Mitsui Mining & Smelting Co., Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
250330 ; 250341 ; 356 30 ; 356432 ;
Abstract
Disclosed is a quantitative evaluation method of optical absorption image which applies rays of light to a sample to obtain a quantitative optical absorption image without using destructive inspection and which can measure automatically and easily the dispersion of resistivity of the sample by calculating the mean value and standard deviation of the quantitative optical absorption image.
Moriya, Kazuo. (1991). Method for quantitative evaluation method of optical absorption image (U.S. Patent No. 5077475). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5077475
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