The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 05, 1991

Filed:

May. 30, 1990
Applicant:
Inventors:

Won G Lee, Kangwon, KR;

Mi Y Kang, Seoul, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L / ; H01L / ;
U.S. Cl.
CPC ...
437195 ; 437913 ; 437982 ; 437228 ; 437241 ; 156653 ;
Abstract

A method of forming a contact hole in a semiconductor device while maintaining intended electrical isolation of electrical conductive material layers, even in the presence of mask misalignment/excessive etching which may occur during the fabrication process of the contact hole and the resulting device are disclosed. The method comprises the formation of an etch barrier layer to provide an isotropic etching barrier and an electrically insulating layer for the conductive material layers which are positioned proximate the contact hole. Thus, when the contact hole is formed by anisotropically etching to expose the surface of the diffusion region an electrical short cannot occur between conductive material layers proximate the contact hole and conductive material which is deposited into the contact hole.


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