The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 15, 1991
Filed:
Dec. 15, 1989
Konomu Hirao, Ibaraki, JP;
Naoki Inamoto, Higashiosaka, JP;
Otsuka Electronics Co., Ltd., Osaka, JP;
Abstract
The present invention utilizes the difference of light reception data generated based on the difference in length of substantial optical diffusion paths between a single light receiving point and a plurality of irradiation points, or between a plurality of light receiving points and a single irradiation point. According to the present invention, the inside information of substance based on the difference in length of the optical diffusion paths, may be measured. Even though measurements are made under different measuring conditions as to the part to be measured, the measuring time, etc., there may be obtained reliable measured data of the inside information with good reproducibility.