The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 17, 1991

Filed:

Nov. 07, 1989
Applicant:
Inventors:

Yoichi Toida, Chigasaki, JP;

Chihiro Marumo, Yokohama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ; G01B / ;
U.S. Cl.
CPC ...
73105 ;
Abstract

A surface roughness measuring instrument is provided with a rotary drive mechanism configured such that two rollers support a sphere at three points, yet the driving torque applied to the sphere at those three points all give an equal tangential velocity. A detector arm is provided between the mounting section for mounting to the surface roughness measuring instrument itself and a tip section which holds skids which make contact with the object to be measured, so that these two sections are able to rock relative to each other about an axis in the direction in which the detector arm extends. Surface roughness in the circumferential direction of a body of rotation can be measured accurately and stably.


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