The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 13, 1991

Filed:

Aug. 02, 1990
Applicant:
Inventor:

Yukihito Kondo, Tokyo, JP;

Assignee:

Jeol Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J / ;
U.S. Cl.
CPC ...
2504421 ; 2504411 ; 2504431 ; 2504401 ;
Abstract

A device for replacing an electron microscope specimen. The device moves a specimen holder from inside the atmosphere onto a specimen stage via a preliminary chamber, the stage being installed in the specimen chamber of the microscope. The device comprises a valve partitioning the preliminary chamber from the specimen chamber, a movable cylinder capable of being moved through the preliminary chamber into the specimen chamber, a hermetic seal, and a lead wire connecting the specimen holder with a terminal. The cylinder has a cover at its front end. The terminal extends through the cover and is insulated from it. A specimen insertion rod is held by a mechanism mounted in the cover. When the cylinder is inserted close to the partition valve, the hermetic seal maintains the specimen chamber airtight.


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