The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 06, 1991
Filed:
Nov. 28, 1989
Applicant:
Inventor:
Robert Lipp, Los Gatos, CA (US);
Assignee:
Cross-Check Technology, Inc., San Jose, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L / ; H01L / ;
U.S. Cl.
CPC ...
437 51 ; 437-7 ; 437-8 ; 437 57 ; 437 48 ; 3241 / ; 3241 / ;
Abstract
Methods for fashioning CrossCheck testing structures allow the testing of high density integrated circuit structures to be made in a space efficient manner. In one method, sense lines and probe lines are disposed in different layers perpendicular to one another and a diffusion line is overlaid in such a manner as to form a sense transistor. In another method, a pair of probe lines are routed between each pair of cells in a manner to form a sense transistor. In still another embodiment circuit layout requires no modification to the basic macrocell structure and a metal interconnection layer is used to couple sense transistors to individual cells.