The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 28, 1991

Filed:

May. 23, 1989
Applicant:
Inventors:

Jeffrey H Dreibelbis, Williston, VT (US);

John A Gabric, Essex Junction, VT (US);

Erik L Hedberg, Essex Junction, VT (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
3241 / ; 3241 / ; 307362 ; 371 221 ;
Abstract

A test selection system is provided which includes a semiconductor substrate having a pin connected thereto and an integrated circuit disposed on the substrate and connected to the pin having an operating voltage within a given voltage range. A latch conditioning circuit having an input responsive to a voltage of a given magnitude has an output connected to a latch, and a voltage control circuit operable at a voltage without the given voltage range selectively applies a control voltage of the given magnitude to the input of the latch conditioning circuit. A voltage without the given voltage range is applied to the pin during a first interval of time to produce the control voltage for establishing a test mode and a voltage within the given voltage range is applied to the pin during a second interval of time to establish a normal operating mode for the integrated circuit.


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