The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 28, 1991

Filed:

Mar. 30, 1989
Applicant:
Inventors:

Gunnar Wennerberg, Cupertino, CA (US);

Daniel A Gordon, Cupertino, CA (US);

Harriss T King, Cupertino, CA (US);

Assignee:

Measurex Corporation, Cupertino, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
250341 ; 2503591 ;
Abstract

A system for detecting optically-sensitive properties of sheet materials during manufacture includes a first group of bundles of optical fibers that convey light to selected transmitting locations adjacent one face of the sheet material. The system further includes a second group of bundles of optical fibers that collect and convey light transmitted through the sheet material to a light detector. The light detector measures the intensity of light received from each of the bundles of the second group to provide measurements of optically-sensitive properties of the sheet material at selected cross-directional locations.


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