The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 30, 1991
Filed:
Jul. 19, 1989
John J Ferris, Titusville, NJ (US);
William Kraft, Cranbury, NJ (US);
Winton H Manning, Princeton, NJ (US);
Michael Martinez, Hopewell, NJ (US);
Educational Testing Service, Princeton, NJ (US);
Abstract
This invention provides automatic testing systems and methods for testing for figural responses to a test inquiry. The testing system includes a test sheet of predetermined dimensions having a grid with a plurality of marking areas arranged in predetermined position and a figural arrangement having a first optical reflectivity arranged within the grid corresponding to one or more of the marking areas. The system includes indicia of a second optical reflectivity overmarking a selected number of the marking areas associated with the figural arrangement and optical scanning means having different optical sensitivities to the first and second optical reflectivities for scanning the sheet to determine the positions of the overmarked areas. The method of testing of this invention includes storing the position of at least one of the marking areas corresponding to a specified figural response to the test inquiry and instructing the test taker to make a figural response to the test inquiry by marking within the grid with indicia of a second optical reflectivity. This method of testing further includes optically scanning the test sheet to determine the positions of the marks made by the test taker and generating data representative of the marked positions, and then comparing the determined positions with stored positions in generating a numerical indication of the comparison of the test takers response to the specified stored response.