The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 16, 1991
Filed:
Dec. 05, 1989
Shigeto Isakozawa, Katsuta, JP;
Takahito Hashimoto, Katsuta, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
An electron microscope and positioning method comprises a stage, an objective lens, a magnifying lens, a magnification setting the magnifying lens, a stage mover for mechanically moving the stage in two directions defining a two dimensional space so as to move a visual field of the speciment and a electrical shifting device which is disposed on opposite sides of an axis of rotation about which the image is rotated through an angle in the two dimensional directions so as to move the visual field in fine increments. The objective lens rotates the electron beam through the angle. A control panel sets the moving distance and moving direction of the stage mover and the electrical shifting device, and a computer selects the stage mover or the electrical shifting device according to the magnification setting and controls the stage mover or the electrical shifting device according to the moving distance and the moving direction. The stage mover and the electrical shifting device are automatically and selectively controlled by the control panel according to the magnification setting without changing the moving direction of the specimen image displayed in an image observing device.