The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 09, 1991

Filed:

Dec. 26, 1989
Applicant:
Inventors:

Noriko Tsutsu, Osaka, JP;

Yoshiro Nakata, Ikoma, JP;

Hideya Esaki, Toyonaka, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H05B / ;
U.S. Cl.
CPC ...
2504841 ; 2504581 ; 2504591 ; 358106 ;
Abstract

A method and apparatus for evaluating the lifetime of a semiconductor device are disclosed. Luminescence of a predetermined wavelength which is emitted from an operating semiconductor device is detected. The luminescence of the predetermined wavelength is one which correlates with the degradation of the semiconductor device. Then, the image of detected luminescence of the predetermined wavelength is processed to determine the place of the degradation caused by hot carriers.


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