The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 02, 1991

Filed:

Jun. 28, 1990
Applicant:
Inventor:

Dale A Jordan, Hillsboro, OR (US);

Assignee:

Tektronix, Inc., Beaverton, OR (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ; G01R / ;
U.S. Cl.
CPC ...
3241 / ; 3241 / ; 324115 ; 324 731 ; 364487 ; 315377 ;
Abstract

Adjustable electronic graticules for measuring waveform distortions are generated from operator inputs indicating a measurement mode and a scale factor. A template of a graticule for the measurement mode in the form of a display list of move and draw instructions is scaled by the scale factor and a measurement value is computed from the scale factor and the instrument units per division setup. The graticule and measurement value are stored as a modified display list. A readout engine interprets the modified display list and produces electrical signals for drawing the graticule and measurement value on a display monitor. The electrical signals are combined with the waveform for display on the display monitor. The operator varies the scale factor until the displayed graticule touches the waveform at a measurement point, and the measurement value is accordingly displayed.


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