The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 02, 1991
Filed:
Jul. 02, 1990
Yukihito Kondo, Tokyo, JP;
Jeol, Ltd., Tokyo, JP;
Abstract
A transmission electron microscope capable of operating in photoelectron emission microscopy mode as well as in transmission electron microscopy mode. A negative voltage is applied to a specimen placed between the magnetic pole pieces of the objective lens. In the photoelectron emission microscopy mode, the specimen is irradiated with exciting rays to induce photoelectrons from the rear surface of the specimen. The exciting rays can be soft x-rays or ultraviolet rays produced from a high-pressure mercury lamp. The soft x-rays can be produced by directing the electron beam emitted from the electron gun of the microscope either onto the specimen or onto one or more targets placed over the specimen.