The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 19, 1991

Filed:

Nov. 28, 1989
Applicant:
Inventor:

Seiichi Suzuki, Tokyo, JP;

Assignee:

Jeol Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J / ;
U.S. Cl.
CPC ...
250311 ; 250306 ;
Abstract

A transmission electron microscope including an input portion such as a keyboard, a central processing unit (CPU), two memories connected with the CPU, an imaging lens system, and a lens control portion connected with the CPU. The imaging lens system comprises an objective lens, intermediate lenses, and a projector lens. The microscope can operate either in image mode or in diffraction mode. In the image mode, excitation currents fed to the lenses can be controlled to rotate the image projected onto the fluorescent screen. In the diffraction mode, the excitation currents are controlled according to data about the orientation of the image so that the projected diffraction pattern may substantially coincide in orientation with the image.


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