The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 26, 1991
Filed:
Sep. 21, 1988
Northern Telecom Limited, Montreal, CA;
Abstract
In a so-called 'scan-design' arrangement for testing integrated circuits, whether at the device level or at system level, problems associated with the storage and handling of vast amounts of data from increasingly complex devices are addressed by testing a pair of identical integrated circuits simultaneously and using the binary vector generated by scanning one of these integrated circuits as the reference against which to compare the binary vector produced by scanning the other integrated circuit. A plurality of 'scan-designed' integrated circuits may be connected in series, possibly in a ring, and each compared with its predecessor. Zero-display coupling across each device may be employed to allow each successive integrated circuit to be compared with the same reference circuit in the chain or ring.