The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 22, 1991

Filed:

Sep. 28, 1988
Applicant:
Inventors:

Shunpei Yamazaki, Tokyo, JP;

Kunio Suzuki, Atsugi, JP;

Susumu Nagayama, Tokyo, JP;

Takashi Inujima, Atsugi, JP;

Masayoshi Abe, Tokyo, JP;

Takeshi Fukada, Ebina, JP;

Mikio Kinka, Atsugi, JP;

Ippei Kobayashi, Atsugi, JP;

Katsuhiko Shibata, Atsugi, JP;

Masato Susukida, Atsugi, JP;

Kaoru Koyanagi, Saku, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C23C / ; C23C / ;
U.S. Cl.
CPC ...
118719 ; 118722 ; 118725 ; 118 501 ;
Abstract

An improved semiconductor processing is desclosed. In the manufacturing process, just formed semiconductor layer undergoes photo annealing and latent dangling bonds are let appear on the surface and gaps, then neutralizer is introduced to the ambience of the semiconductor. The semiconductor thus formed demonstrates SEL effect in place of Staebler-Wronski effect.


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