The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 04, 1990

Filed:

Sep. 15, 1989
Applicant:
Inventors:

Naohiro Kimata, Tokyo, JP;

Takayoshi Yoshida, Tokyo, JP;

Ikuo Oyake, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
382 44 ; 382 42 ;
Abstract

A rectangular source image formed by pixels in a two-axis coordinate system is transformed to a destination image by mapping vertices of the source image onto vertices of the destination image, then mapping edges of the destination image onto edges of the source image, mapping scan lines in the destination image onto the source image, and assigning to pixels on these scan lines the values of corresponding pixels in the source image. DDA algorithms are employed for the edge mapping and scan line mapping steps. This method enables arbitrary affine transformations, including combinations of a rotation with an enlargement or reduction, to be executed without introducing image defects.


Find Patent Forward Citations

Kimata, Naohiro. (1990). Image transformation method and device (U.S. Patent No. 4975976). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4975976

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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