The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 20, 1990
Filed:
Mar. 21, 1988
Applicant:
Inventors:
Joseph E Ahnell, Hydes, MD (US);
H Mark Perks, Baltimore, MD (US);
Mark L Sussman, Baltimore, MD (US);
Gregory Tice, Lutherville, MD (US);
Assignee:
Becton, Dickinson and Company, Franklin Lakes, NJ (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C12Q / ; C12M / ;
U.S. Cl.
CPC ...
435 29 ; 435 34 ; 435291 ; 435313 ; 435807 ; 436146 ;
Abstract
An apparatus and method for the detection of the growth of microorganisms through infrared analysis of a sample of the gas produced by growth of the microorganism is descirbed. In the method, a sample of the headspace gas in a vial containing a growth medium which has been inoculated with a sample suspected of containing a microorganism is removed and transferred to a sample cell where infrared analysis is used to determine the presence of carbon dioxide, if any, produced by the growth of the microorganism.