The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 13, 1990

Filed:

May. 19, 1989
Applicant:
Inventor:

Yoji Sonobe, Machida, JP;

Assignee:

Anritsu Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J / ;
U.S. Cl.
CPC ...
356326 ; 356328 ; 356308 ; 356334 ;
Abstract

A dispersion-type spectral element designed for reflecting an incident sample light is rotated by a drive mechaism. The sample light reflected by the element is applied to a sample-light receiving device. The device converts the light into a first signal representing the intensity of the sample light. Reference light consisting of beams having various wavelengths over a broad range is supplied from a reference light source to the spectral element. Further, standard light consisting of one beam of a known wavelength is also supplied from a standard light source to the spectral element. The reference light reflected by the element is applied to a reference-light receiving device. The reference-light receiving device converts the reference light into a second signal representing the intensity of the light. An etalon is located in the optical path between the spectral element and the reference-light receiving device. The standard light reflected by the element is applied to the standard-light receiving device. The standard-light receiving device converts the standard light into a third signal representing the intensity of the standard light. An arithmetic unit receives the first, second, and third signals separately, and obtains from the second and third signals a wavelength scale used for calculating from the first signal the wavelength of the sample light.


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